Characterization of optical properties of nanostructured materials
Design, fabrication and characterization of low dimensional photonics systems leveraging advances in several metrology fields (e.g. metamaterials, 2D materials, nanowires, porous materials).
Self-assembled photonic metasurfaces
In the light of the revision of the International System of Units (SI), in article number 2000009 Gianluca Milano and co‐workers discuss on the possibility of using memristive devices for quantum metrology. Exhibiting quantized conductance phenomena in air at room temperature, memristive devices can be exploited for the realization of a resistance standard implementable on‐chip for self‐calibrating systems with zero‐chain traceability.